Contact Potential Measurement of Cleaved Mirror Surface of 1.3 Um Buried Heterostructure Laser Diode By Kelvin Probe Force Microscopy

By: Material type: ArticleArticleDescription: 1662-1662 pSubject(s): In: IET:IEE: Electronics Letters
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Articles Articles Periodical Section Vol.38, No.25 (Dec. 2002) Available

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