Adaptive Body Bias for Reducting Impacts of Die-to Die and within-Die Parameter Variations on Microprocessor Frequency Adn Leakage

By: Material type: ArticleArticleDescription: 1396-1402 pSubject(s): In: Ieee Journal of Solid-State Circuits
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Articles Articles Periodical Section Vol.37, No.11 (Nov. 2002) Available

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