Fast Parameter Extraction for Multiconductor Interconnects in Multilayered Dielectric Media Using Mixture Method of Equivalent Source and Measured Equation of Invariance

By: Material type: ArticleArticleDescription: 235-240 pSubject(s): In: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
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Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.20, No.03 (Aug. 1997) Available

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