Method to PreventMalfunction Caused byTrans Former Magnetizing Inrush Current Using Iec 61850-Based Ied and Dynamic Performance Test Using Rtds Test-Bed

By: Material type: ArticleArticleDescription: 1104-1111 pSubject(s): In: Journal of Electrical Engineering and Technology
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Articles Articles Periodical Section Vol.09, No.03 (May. 2014) Available

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