Entry Personal Name

Number of records used in: 2

001 - CONTROL NUMBER

• control field: 811802

003 - CONTROL NUMBER IDENTIFIER

• control field: NEDUET

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20230819174559.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 230819|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

• Original cataloging agency: NEDUET
• Transcribing agency: NEDUET

100 ## - HEADING--PERSONAL NAME

• Personal name: Shi, F.G

670 ## - SOURCE DATA FOUND

• Source citation: Work cat.: (NEDUET)764224: Zhou, H 811801, Thickness Dependent Dielectric Breakdown of Pecvd Low-K Carbon Doped Silicon Dioxide Dielectric Thin Films: Modeling and Experiments