Entry Personal Name

Number of records used in: 1

001 - CONTROL NUMBER

• control field: 781075

003 - CONTROL NUMBER IDENTIFIER

• control field: NEDUET

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20230819162905.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 230819|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

• Original cataloging agency: NEDUET
• Transcribing agency: NEDUET

100 ## - HEADING--PERSONAL NAME

• Personal name: Shiota, Takaaki

670 ## - SOURCE DATA FOUND

• Source citation: Work cat.: (NEDUET)745490: Satoh, Yuhki 781074, Simulation of Degradation of Dielectric Breakdown Field of Thermal Sio2 Films Due to Voids Si Wafers