Normal view MARC view

Entry Personal Name

Number of records used in: 1

001 - CONTROL NUMBER

  • control field: 778059

003 - CONTROL NUMBER IDENTIFIER

  • control field: NEDUET

005 - DATE AND TIME OF LATEST TRANSACTION

  • control field: 20230819162448.0

008 - FIXED-LENGTH DATA ELEMENTS

  • fixed length control field: 230819|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

  • Original cataloging agency: NEDUET
  • Transcribing agency: NEDUET

100 ## - HEADING--PERSONAL NAME

  • Personal name: Ipposhi, Talashi

670 ## - SOURCE DATA FOUND

  • Source citation: Work cat.: (NEDUET)744191: Maeda, Shigenobu 777246, An Analytical Method of Evaluating Variation OfThreshold Voltage Shift Caused byNegative-Bias Temperature Stress in Poly-Si Tft'S
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