Normal view
MARC view
Entry Topical Term
001 - CONTROL NUMBER
- control field: 775809
003 - CONTROL NUMBER IDENTIFIER
- control field: NEDUET
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20230819162147.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 230819|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: NEDUET
- Transcribing agency: NEDUET
150 ## - HEADING--TOPICAL TERM
- Topical term or geographic name entry element: Structured Dispersion
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (NEDUET)743307: Zorian, Yervant 775808, A Structured Testability Approach for Multi-Chip Modules Based on Bist and Boundary-Scan