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Entry Topical Term
001 - CONTROL NUMBER
- control field: 756636
003 - CONTROL NUMBER IDENTIFIER
- control field: NEDUET
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20230819155132.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 230819|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: NEDUET
- Transcribing agency: NEDUET
150 ## - HEADING--TOPICAL TERM
- Topical term or geographic name entry element: Young'S Modulus and Yield Strength of Porous Low-K Dielectric Films
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (NEDUET)734856: Herrmann, M 756634, Determination of Young'S Modulus and Yield Strength of Porous Low-K Dielectric Films by Nanoindentation Under Complete Consideration OfSubstrate Influence