Normal view
MARC view
Entry Personal Name
001 - CONTROL NUMBER
- control field: 753382
003 - CONTROL NUMBER IDENTIFIER
- control field: NEDUET
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20230819154050.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 230819|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: NEDUET
- Transcribing agency: NEDUET
100 ## - HEADING--PERSONAL NAME
- Personal name: Kim, Insoo
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (NEDUET)733452: Kim, Jung-Tae 753381, A Novel High Er Formance Scan Architecture with Dmuxed Scan Flip-Flop for Low Shift Power Testing