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Identifying Untestable Faults in Sequential Circuits. (Record no. 805893)

MARC details
000 -LEADER
fixed length control field	00370nab a2200121Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field	230808s1995 \|\|\|\|\|\|\|f \|\|\|\| 00\| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name	Chen, Jwu E
9 (RLIN)	818910
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name	Liang, Hsing-Chung
9 (RLIN)	864941
245 #0 - TITLE STATEMENT
Title	Identifying Untestable Faults in Sequential Circuits.
300 ## - PHYSICAL DESCRIPTION
Extent	14-23 p.
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication	1995
Title	Ieee Design and Test of Computers
International Standard Serial Number	07407475
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type	Articles
--	51
--	ABUL KALAM Library

Holdings
Not for loan	Home library	Serial Enumeration / chronology	Total Checkouts	Date last seen	Koha item type
	Engr Abul Kalam Library	Vol.12, No.03 (Jul. 1995)		20/08/2023	Articles