Design and Test of Large Embedded Memories: An Overview (Record no. 777829)

MARC details
000 -LEADER
fixed length control field 00417nab a2200133Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2001 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Rajsuman, Rochit
9 (RLIN) 246141
245 #0 - TITLE STATEMENT
Title Design and Test of Large Embedded Memories: An Overview
300 ## - PHYSICAL DESCRIPTION
Extent 16-27 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Design and Test
9 (RLIN) 821342
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Embedded Memories
9 (RLIN) 769002
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2001
Title Ieee Design and Test of Computers
International Standard Serial Number 07407475
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.18, No.03 (May. 2001)   20/08/2023 Articles
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