Automatic Measurement System for Degradation Analysis in Thin-Film Aicu Metallizations (Record no. 775637)

MARC details
000 -LEADER
fixed length control field 00519nab a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2002 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Catelani, M.
9 (RLIN) 820319
245 #0 - TITLE STATEMENT
Title Automatic Measurement System for Degradation Analysis in Thin-Film Aicu Metallizations
300 ## - PHYSICAL DESCRIPTION
Extent 401-407 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Automatic
9 (RLIN) 675153
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Measurement System Data Handling
9 (RLIN) 826529
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Thin - Film Devices
9 (RLIN) 235439
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2002
Title Ieee Transactions on Instrumentation and Measurement
International Standard Serial Number 00189456
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.51, No.03 (Jun. 2002)   19/08/2023 Articles
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