Guest Editors' Introduction: Test Trade-offs Take Center Stage At Itc (Record no. 773533)
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000 -LEADER | |
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fixed length control field | 00412nab a2200133Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s2001 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Ambler, tony |
9 (RLIN) | 823016 |
245 #0 - TITLE STATEMENT | |
Title | Guest Editors' Introduction: Test Trade-offs Take Center Stage At Itc |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 59-59 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Test Trade-offs |
9 (RLIN) | 823017 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Itc |
9 (RLIN) | 823018 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 2001 |
Title | Ieee Design and Test of Computers |
International Standard Serial Number | 07407475 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
---|---|---|---|---|---|
Engr Abul Kalam Library | Vol.18, No.05 (Sep. 2001) | 19/08/2023 | Articles |