Mosfet Degradation Kinetics and Its Simulation (Record no. 760002)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00461nab a2200157Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 230808s2003 |||||||f |||| 00| 0 eng d |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Penzin, Oleg |
| 9 (RLIN) | 806522 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Haggag, A |
| 9 (RLIN) | 806523 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Hess, K |
| 9 (RLIN) | 780536 |
| 245 #0 - TITLE STATEMENT | |
| Title | Mosfet Degradation Kinetics and Its Simulation |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1445-1451 p. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Mosfet |
| 9 (RLIN) | 720139 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Reliability |
| 9 (RLIN) | 53955 |
| 773 ## - HOST ITEM ENTRY | |
| Place, publisher, and date of publication | 2003 |
| Title | Ieee Transactions on Electron Devices |
| International Standard Serial Number | 00189383 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Articles |
| -- | 51 |
| -- | ABUL KALAM Library |
| Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
|---|---|---|---|---|---|
| Engr Abul Kalam Library | Vol.50, No.06 (Jun. 2003) | 19/08/2023 | Articles |