Measurement Time Reduction for Generation lifetimes (Record no. 745180)
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000 -LEADER | |
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fixed length control field | 00459nab a2200145Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s1999 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Lee, Sang-Yun |
9 (RLIN) | 780366 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Schroder, Dieter K. |
245 #0 - TITLE STATEMENT | |
Title | Measurement Time Reduction for Generation lifetimes |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1016-1021 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Charge Carrier lifetime |
9 (RLIN) | 730853 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Mos Capacitor |
9 (RLIN) | 769357 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 1999 |
Title | IEEE Transactions on Electron Devices |
International Standard Serial Number | 00189383 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
---|---|---|---|---|---|
Engr Abul Kalam Library | Vol.46, No.05 (May. 1999) | 19/08/2023 | Articles |