Modeling Intermediate Tests for Fault-Tolerant Multichip Module Systems (Record no. 743793)

MARC details
000 -LEADER
fixed length control field 00562nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1995 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kim, Sungsoo
9 (RLIN) 777012
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Lombardi, Fabrizio
9 (RLIN) 767027
245 #0 - TITLE STATEMENT
Title Modeling Intermediate Tests for Fault-Tolerant Multichip Module Systems
300 ## - PHYSICAL DESCRIPTION
Extent 448-455 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Modeling
9 (RLIN) 15553
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Tests
9 (RLIN) 169411
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Multichip Module
9 (RLIN) 767028
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1995
Title IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
International Standard Serial Number 10709894
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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  Engr Abul Kalam Library Vol.18, No.03 (Aug. 1995)   19/08/2023 Articles
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