limitations of Conductance ToMeasurement OfInterface State Density of Mos Capacitoras with Tunneling Gate Gate Dielectrdics (Record no. 741294)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 00605nab a2200169Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 230808s2000 |||||||f |||| 00| 0 eng d |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Vogel, Eric M. |
| 9 (RLIN) | 770952 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Henson, W. Kirklen |
| 9 (RLIN) | 770953 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Suehle, John S. |
| 9 (RLIN) | 770954 |
| 245 #0 - TITLE STATEMENT | |
| Title | limitations of Conductance ToMeasurement OfInterface State Density of Mos Capacitoras with Tunneling Gate Gate Dielectrdics |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 601-608 p. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Capacitance |
| 9 (RLIN) | 707591 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Conductance |
| 9 (RLIN) | 770956 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Dielectric Films |
| 9 (RLIN) | 496077 |
| 773 ## - HOST ITEM ENTRY | |
| Place, publisher, and date of publication | 2000 |
| Title | IEEE Transactions on Electron Devices |
| International Standard Serial Number | 00189383 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Articles |
| -- | 51 |
| -- | ABUL KALAM Library |
| Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
|---|---|---|---|---|---|
| Engr Abul Kalam Library | Vol.47, No.03 (Mar. 2000) | 19/08/2023 | Articles |