Optimization and Characterization of Gate Electrode Dependent Flicker Noise in Silicon Nanowire Tansistors (Record no. 721439)

MARC details
000 -LEADER
fixed length control field 00546nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2014 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Anandan, P.
9 (RLIN) 717347
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Mohankumar, N.
9 (RLIN) 717348
245 #0 - TITLE STATEMENT
Title Optimization and Characterization of Gate Electrode Dependent Flicker Noise in Silicon Nanowire Tansistors
300 ## - PHYSICAL DESCRIPTION
Extent 1343-1348 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Flicker Noise
9 (RLIN) 717349
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Silicon
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Power Spectra Density
9 (RLIN) 717350
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2014
Title Journal of Electrical Engineering and Technology
International Standard Serial Number 19750102
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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  Engr Abul Kalam Library Vol.09, No.04 (Jul. 2014)   19/08/2023 Articles
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