Normal view MARC view ISBD view

Dc Analysis of Circuits with Idealized Diodes Considering Reverse Bias Breakdown Phenomenon.

Tadeusiewicz, M

Dc Analysis of Circuits with Idealized Diodes Considering Reverse Bias Breakdown Phenomenon. - 312-326 p.

Subjects--Topical Terms:
Dc Solutions
Idealized Diodes

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)