Design- for -Testability Techniques for Detecting Delay Faults in Cmos/Bicomos Logic Families.
Raahemifar, K Ahmadi, M
Design- for -Testability Techniques for Detecting Delay Faults in Cmos/Bicomos Logic Families. - 1279-1290 p.
Concurrent Testing
Delay Fault and Stuck Open Fault Testing
Design- for -Testability Techniques for Detecting Delay Faults in Cmos/Bicomos Logic Families. - 1279-1290 p.
Concurrent Testing
Delay Fault and Stuck Open Fault Testing