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Soi N-Mosfet Low-Frequency Noise Measurements and Modeling from Room Temperature Up to 250 C

Dessard, V Iniguez, B Adriaensen, S Flandre, D

Soi N-Mosfet Low-Frequency Noise Measurements and Modeling from Room Temperature Up to 250 C - 1289-1295 p.

Subjects--Topical Terms:
Body Effects
Lorentzian
Noise Measurement

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