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ModelingFringing Electric Field Effect onThreshold Voltage of Fd Soi Nmos Devices withLdd/Sidewall Oxide Spacer Structure

Lin, L-F

ModelingFringing Electric Field Effect onThreshold Voltage of Fd Soi Nmos Devices withLdd/Sidewall Oxide Spacer Structure - 2559-2578 p.

Subjects--Topical Terms:
Devices
Fringe Patterns

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