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Pulsed Measurements and Circuit Modeling of Weak and Strong Avalanche Effects in Gaas Mesfets and Hemts

Meneghesso, Gaudenzio Chini, Alessandro Zanoni, Enrico

Pulsed Measurements and Circuit Modeling of Weak and Strong Avalanche Effects in Gaas Mesfets and Hemts - 324-332 p.

Subjects--Topical Terms:
Breakdown
Circuit Modeling
Pulsed Measurements

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