Normal view MARC view ISBD view

Chisel Programming Operation of Scaled Nor Flash Eeproms-Effect of Voltage Scaling, Device Scaling and Technological Parameters

Mohapatra, Nihar R

Chisel Programming Operation of Scaled Nor Flash Eeproms-Effect of Voltage Scaling, Device Scaling and Technological Parameters - 2104-2111 p.

Subjects--Topical Terms:
Channel Hot Electron (Che)

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)