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An Evaluation of Mos Interface-Trap Charge Pump As An Ultralow Constant-Current Generator

Cilingiroglu, Ugur Gomez, Adriana Becker- Veeder, Kenton T

An Evaluation of Mos Interface-Trap Charge Pump As An Ultralow Constant-Current Generator - 71-83 p.

Subjects--Topical Terms:
Charge Pumping
Cmos Transconductors
Ultralow Current Generation

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