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Average Drift Mobilty and Apparent Sheet-Electron Density Profiles in Strained-Si-Sige Buried-Channel Depletion-Mode N-Mosfets

Michelakis, Kostis Vilches, Antonio

Average Drift Mobilty and Apparent Sheet-Electron Density Profiles in Strained-Si-Sige Buried-Channel Depletion-Mode N-Mosfets - 1309-1314 p.

Subjects--Topical Terms:
Drift Mobility
Heterostructure
Metal-Oxide Semiconductor

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