Normal view MARC view ISBD view

Direct Experimental Verfication of Shot Noise in Short Channel Mos Transistors

andersson, S Svensson, C.

Direct Experimental Verfication of Shot Noise in Short Channel Mos Transistors - 869-870 p.

Subjects--Topical Terms:
Semiconductor Technology

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)