Normal view MARC view ISBD view

Reliability Assessment of Embedded Digital System Using Multi-State Function

Choi, Jong Gyun

Reliability Assessment of Embedded Digital System Using Multi-State Function - 261-269 p.

Subjects--Topical Terms:
Reliability Assessment
Embedded Digital System

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)