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A Multifunctional Test Chip for Microelectronic Packaging and Its Application on Rf Property Measurements

Tseng, K F Hsion, Y H

A Multifunctional Test Chip for Microelectronic Packaging and Its Application on Rf Property Measurements - 633-643 p.

Subjects--Topical Terms:
Multifunctional Test Chip
Rlc Measurement
Inductance

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