Design onLow-Leakage Diode String for Using InPower-Rail Esd Clamp Circuits in a 0.35-Um Silicide Cmos Process

Ker, Ming-Dou Lo, Wen-Yu

Design onLow-Leakage Diode String for Using InPower-Rail Esd Clamp Circuits in a 0.35-Um Silicide Cmos Process - 601-611 p.


Electrostatic Discharge (Esd)
Latch-Up
Esd Protection Circuit
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