Normal view MARC view ISBD view

High-Temperatature Characteristics of High-Quality Sic Mis Capacitors with O/N/O Gate Dielectric

Wang, Xiewen W. Ma, Tso-Ping

High-Temperatature Characteristics of High-Quality Sic Mis Capacitors with O/N/O Gate Dielectric - 458-463 p.

Subjects--Topical Terms:
Dielectric Films
High Power
High Temperature

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)