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A Comparison of Hot-Carrier Degradation in Tungsten Polycide Gate and Poly Gate P-Mosfet'S

Ang, D. S. ling, C. H.

A Comparison of Hot-Carrier Degradation in Tungsten Polycide Gate and Poly Gate P-Mosfet'S - 895-903 p.

Subjects--Topical Terms:
Gate-To-Drain Capacitance
Hot-Carrier Degradation
Tungsten Polycide

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