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Direct Lateral Profiling of Hot-Carrier-Induced Oxide Charge and Interface Traps in Thin Gate Mosfet'S

Chen, Chun Ma, T.P

Direct Lateral Profiling of Hot-Carrier-Induced Oxide Charge and Interface Traps in Thin Gate Mosfet'S - 512-520 p.

Subjects--Topical Terms:
Direct Lda

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