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Electron Beam Induced Current Imaging of Near-Contact Regions in Semi-Insulating Gaas

Brennan, S Chriss, M. F. White, White

Electron Beam Induced Current Imaging of Near-Contact Regions in Semi-Insulating Gaas - 2024-2031 p.

Subjects--Topical Terms:
Contacts
Electric Fields
Semi-Ipns

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