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Dynamic-Stress-Induced Enhanced Degradation of 1/F Noise in N-Mosfet'S

Xu, J. P. Cheng, Y.C.

Dynamic-Stress-Induced Enhanced Degradation of 1/F Noise in N-Mosfet'S - 109-112 p.

Subjects--Topical Terms:
Nitridation
Dynamic Stresses
Mosfet

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