Normal view MARC view ISBD view

Interaction of Interface-Traps Located at Various Sites in Mosfets Under Stress

Chen, Gang li, M. F

Interaction of Interface-Traps Located at Various Sites in Mosfets Under Stress - 387-391 p.

Subjects--Topical Terms:
Annealing
Hot Carrier
Mosfet

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)