Normal view MARC view ISBD view

Thed Characterizing Analysis of a Buried-Channel Mosfet Based on The-3-D Numerical Simulation

Kim, Man-Ho Kim, Jongsoo

Thed Characterizing Analysis of a Buried-Channel Mosfet Based on The-3-D Numerical Simulation - 267-273 p.

Subjects--Topical Terms:
Buried Channel
Narrow Channel Effect

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)