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The Impact of Low-Holding-Voltage Issue in High-Voltage Cmos Technology andDesign of Latchup-Free Power-Rail Esd Clamp Circuit for Lcd Driver Ics

Ker, Ming-Dou lin, Kun-Hsien

The Impact of Low-Holding-Voltage Issue in High-Voltage Cmos Technology andDesign of Latchup-Free Power-Rail Esd Clamp Circuit for Lcd Driver Ics - 1751-1759 p.

Subjects--Topical Terms:
Electrostatic Discharge (Esd)
Power-Rail Esd Clamp Circuit
Latchup

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