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In Situ Observation of Cracks in Gold Nano-Interconnects on Flexible Substrates

Olilges, Sven

In Situ Observation of Cracks in Gold Nano-Interconnects on Flexible Substrates - 175-178 p.

Subjects--Topical Terms:
Scanning Electron Microscopy
Nanocrystalilne
Multilayer Thin Films

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