Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits
Bushnell, Michael L.
Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits - New York : Springer, c2000 - XVIII, 690 p. : ill - Frontiers in Electronic Testing .
Includes Bibliographical References and Index
0792379918
Digital Integrated Circuits Testing
Integrated Circuits Very Large Scale Integration Testing
Mixed Signal Circuits Testing
621.395 / BUS
Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits - New York : Springer, c2000 - XVIII, 690 p. : ill - Frontiers in Electronic Testing .
Includes Bibliographical References and Index
0792379918
Digital Integrated Circuits Testing
Integrated Circuits Very Large Scale Integration Testing
Mixed Signal Circuits Testing
621.395 / BUS